Contrast in X-ray section topographs of perfect silicon crystals using the Laue-Laue three-beam case of diffractionHEYROTH, F; HÖCHE, H.-R; EISENSCHMIDT, C et al.Journal of applied crystallography. 1999, Vol 32, pp 489-496, issn 0021-8898, 3Article

X-ray topography of perfect crystals using the laue-laue three-beam case of diffractionHEYROTH, F; EISENSCHMIDT, C; HÖCHE, H.-R et al.Crystal research and technology (1979). 1998, Vol 33, Num 4, pp 547-554, issn 0232-1300Article

Internal strain formed in oxide ceramics upon spark-plasma sinteringHÖCHE, T; SHEN, Z; NYGREN, M et al.Philosophical magazine (2003. Print). 2007, Vol 87, Num 28-30, pp 4555-4566, issn 1478-6435, 12 p.Article

Imaging of the energy flow in the three-beam case of x-ray diffractionHEYROTH, F; HÖCHE, H.-R; EISENSCHMIDT, C et al.Journal of physics. D, Applied physics (Print). 1999, Vol 32, Num 10A, pp A133-A138, issn 0022-3727Article

Electrical and Structural Real-Time Changes in Thin Thermoelectric (Bi_0.15Sb_0.85)₂Te₃ Films by Dynamic Thermal TreatmentROTHE, K; STORDEUR, M; HEYROTH, F et al.Journal of electronic materials. 2010, Vol 39, Num 9, pp 1408-1412, issn 0361-5235, 5 p.Conference Paper

Manifestation of incommensurate structural modulations in the Ti-L_2-3 electron energy-loss near-edge structure of Sr₂TiSi₂O₈HÖCHE, T; GRODZICKI, M; HEYROTH, F et al.Philosophical magazine letters. 2007, Vol 87, Num 6, pp 431-439, issn 0950-0839, 9 p.Article

Pinhole topography in the three-beam case of x-ray diffraction: experiment and theoryHEYROTH, F; ZELLNER, J; HÖCHE, H-R et al.Journal of physics. D, Applied physics (Print). 2001, Vol 34, Num 10A, pp A151-A157, issn 0022-3727Article

Dislocation and cracks at Vickers indentations in (0 0 0 1) GaN single crystalsRATSCHINSKI, I; LEIPNER, H. S; HEYROTH, F et al.Philosophical magazine letters. 2010, Vol 90, Num 8, pp 565-571, issn 0950-0839, 7 p.Article

High-resolution analytical electron microscopy of catalytically etched silicon nanowiresSCHADE, M; GEYER, N; FUHRMANN, B et al.Applied physics. A, Materials science & processing (Print). 2009, Vol 95, Num 2, pp 325-327, issn 0947-8396, 3 p.Article

On the growth mechanism and optical properties of ZnO multi-layer nanosheetsFAN, H. J; SCHOLZ, R; KOLB, F. M et al.Applied physics. A, Materials science & processing (Print). 2004, Vol 79, Num 8, pp 1895-1900, issn 0947-8396, 6 p.Article

Two- and three-beam X-ray diffraction imaging of domains in magnetiteMEDRANO, C; HEYROTH, F; SCHLENKER, M et al.Journal of applied crystallography. 1998, Vol 31, pp 726-732, issn 0021-8898, 5Article